A Scanning Electron Microscope for Ultracold Atoms

We propose a new technique for the detection of single atoms in ultracold quantum gases. The technique is based on scanning electron microscopy and employs the electron impact ionization of trapped atoms with a focussed electron probe. Subsequent detection of the resulting ions allows for the reconstruction of the atoms position. This technique is expected to achieve a much better spatial resolution compared to any optical detection method. In combination with the sensitivity to single atoms, it makes new in situ measurements of atomic correlations possible. The detection principle is also well suited for the addressing of individual sites in optical lattices. Working principle of the electron microscope: A focussed electron beam is directed onto the ultracold atoms. The atoms are ionized by electron impact and the resulting ions are detected. c © 2004 by HMS Consultants, Inc. Published exclusively by WILEY-VCH Verlag GmbH & Co. KGaA A Scanning Electron Microscope for Ultracold Atoms T. Gericke, C. Utfeld, N. Hommerstad, and H. Ott ∗ Institut für Physik, Johannes Gutenberg Universität, 55099 Mainz, Germany